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Secondary Ion Mass Spectrometry SIMS III: Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30-September 5, 1981 - Springer Series in Chemical Physics A Benninghoven Softcover reprint of the original 1st ed. 1982 edition
Secondary Ion Mass Spectrometry SIMS III: Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30-September 5, 1981 - Springer Series in Chemical Physics
A Benninghoven
Today it is extensively and successfully applied in such different fields as depth profiling and imaging of semiconductor devices, in isotope analysis of minerals, in imaging biological tissues, in the study of catalysts and catalytic reactions, in oxide-layer analysis on metals in drug detection, and in the analysis of body fluids.
458 pages, biography
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | July 26, 2012 |
| ISBN13 | 9783642881541 |
| Publishers | Springer-Verlag Berlin and Heidelberg Gm |
| Pages | 447 |
| Dimensions | 155 × 235 × 24 mm · 639 g |
| Language | German |
| Editor | Benninghoven, A. |
| Editor | Giber, J. |
| Editor | Laszlo, J. |
| Editor | Riedel, M. |
| Editor | Werner, H.W. |
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