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Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983 - Springer Series in Chemical Physics A Benninghoven Softcover reprint of the original 1st ed. 1984 edition
Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983 - Springer Series in Chemical Physics
A Benninghoven
(4) Outstanding SIMS-related analytical methods such as laser-microprobe SIMS, sputtered neutral mass spectrometry, mass spectrometry of sputtered neutrals by multi-photon resonance ionization, and accelerator-based SIMS.
506 pages, black & white illustrations, bibliography
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | January 10, 2012 |
| ISBN13 | 9783642822582 |
| Publishers | Springer-Verlag Berlin and Heidelberg Gm |
| Pages | 506 |
| Dimensions | 155 × 235 × 27 mm · 730 g |
| Language | German |
| Editor | Benninghoven, A. |
| Editor | Okano, J. |
| Editor | Shimizu, R. |
| Editor | Werner, H.W. |
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