Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983 - Springer Series in Chemical Physics - A Benninghoven - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642822582 - January 10, 2012
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Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983 - Springer Series in Chemical Physics Softcover reprint of the original 1st ed. 1984 edition

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(4) Outstanding SIMS-related analytical methods such as laser-microprobe SIMS, sputtered neutral mass spectrometry, mass spectrometry of sputtered neutrals by multi-photon resonance ionization, and accelerator-based SIMS.


506 pages, black & white illustrations, bibliography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released January 10, 2012
ISBN13 9783642822582
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 506
Dimensions 155 × 235 × 27 mm   ·   730 g
Language German  
Editor Benninghoven, A.
Editor Okano, J.
Editor Shimizu, R.
Editor Werner, H.W.

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