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Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization Sheldon Tan 2019 edition
Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
Sheldon Tan
460 pages, 195 Illustrations, color; 16 Illustrations, black and white; XLI, 460 p. 211 illus., 195
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | September 25, 2020 |
| ISBN13 | 9783030261740 |
| Publishers | Springer Nature Switzerland AG |
| Pages | 460 |
| Dimensions | 150 × 220 × 10 mm · 765 g |
| Language | German |