Tell your friends about this item:
Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization Sheldon Tan 2019 edition
Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
Sheldon Tan
460 pages, 195 Illustrations, color; 16 Illustrations, black and white; XLI, 460 p. 211 illus., 195
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | September 25, 2019 |
| ISBN13 | 9783030261719 |
| Publishers | Springer Nature Switzerland AG |
| Pages | 460 |
| Dimensions | 150 × 220 × 20 mm · 916 g |
| Language | German |