Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization - Sheldon Tan - Books - Springer Nature Switzerland AG - 9783030261719 - September 25, 2019
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Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization 2019 edition

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460 pages, 195 Illustrations, color; 16 Illustrations, black and white; XLI, 460 p. 211 illus., 195

Media Books     Hardcover Book   (Book with hard spine and cover)
Released September 25, 2019
ISBN13 9783030261719
Publishers Springer Nature Switzerland AG
Pages 460
Dimensions 150 × 220 × 20 mm   ·   916 g
Language German  

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