Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield - Mohamed Abu Rahma - Books - Springer-Verlag New York Inc. - 9781493902200 - October 15, 2014
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Mohamed Abu Rahma
Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield 2013 edition

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This essential reference combines state-of-the-art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. It shows designers how to apply practical techniques that optimize memory yield.

172 pages, 5 black & white tables, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 15, 2014
ISBN13 9781493902200
Publishers Springer-Verlag New York Inc.
Pages 172
Dimensions 155 × 235 × 10 mm   ·   272 g
Language English  

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