Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield - Mohamed Abu Rahma - Books - Springer-Verlag New York Inc. - 9781461417484 - September 27, 2012
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Mohamed Abu Rahma
Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield 2013 edition

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This essential reference combines state-of-the-art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. It shows designers how to apply practical techniques that optimize memory yield.

210 pages, 147 black & white illustrations, 6 colour illustrations, 5 black & white tables, biograph

Media Books     Hardcover Book   (Book with hard spine and cover)
Released September 27, 2012
ISBN13 9781461417484
Publishers Springer-Verlag New York Inc.
Pages 172
Dimensions 155 × 235 × 15 mm   ·   385 g
Language English  

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