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Life-Cycle Assessment of Semiconductors Sarah B. Boyd 2012 edition
Life-Cycle Assessment of Semiconductors
Sarah B. Boyd
Life-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices.
226 pages, biography
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | September 17, 2014 |
| ISBN13 | 9781489992239 |
| Publishers | Springer-Verlag New York Inc. |
| Pages | 226 |
| Dimensions | 155 × 235 × 14 mm · 362 g |
| Language | English |