Life-Cycle Assessment of Semiconductors - Sarah B. Boyd - Books - Springer-Verlag New York Inc. - 9781489992239 - September 17, 2014
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Life-Cycle Assessment of Semiconductors 2012 edition

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Life-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices.


226 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 17, 2014
ISBN13 9781489992239
Publishers Springer-Verlag New York Inc.
Pages 226
Dimensions 155 × 235 × 14 mm   ·   362 g
Language English  

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