Life-Cycle Assessment of Semiconductors - Sarah B. Boyd - Books - Springer-Verlag New York Inc. - 9781441999870 - October 12, 2011
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Sarah B. Boyd
Life-Cycle Assessment of Semiconductors 2012 edition

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Life-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices.

226 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released October 12, 2011
ISBN13 9781441999870
Publishers Springer-Verlag New York Inc.
Pages 226
Dimensions 155 × 235 × 15 mm   ·   535 g
Language English  

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