Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces - Springer Theses - Weronika Walkosz - Books - Springer-Verlag New York Inc. - 9781461428572 - May 28, 2013
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Weronika Walkosz
Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces - Springer Theses 2011 edition

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This book offers results that influence many high temperature and pressure applications. It provides findings that will offer increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.

176 pages, 2 black & white tables, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released May 28, 2013
ISBN13 9781461428572
Publishers Springer-Verlag New York Inc.
Pages 110
Dimensions 155 × 235 × 6 mm   ·   185 g
Language English  

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