Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces - Springer Theses - Weronika Walkosz - Books - Springer-Verlag New York Inc. - 9781441978165 - April 19, 2011
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Weronika Walkosz
Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces - Springer Theses 2011 edition

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This book offers results that influence many high temperature and pressure applications. It provides findings that will offer increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.

176 pages, 2 black & white tables, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released April 19, 2011
ISBN13 9781441978165
Publishers Springer-Verlag New York Inc.
Pages 110
Dimensions 162 × 241 × 12 mm   ·   317 g
Language English  

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