Recent Advances in PMOS Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Material and Process Impact - - Books - Springer Verlag, Singapore - 9789811661228 - November 27, 2022
In case cover and title do not match, the title is correct

Recent Advances in PMOS Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Material and Process Impact 2022 edition

Price
$ 156.49
excl. VAT

Ordered from remote warehouse

Expected to be ready for shipping Jul 8 - 14

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Also available as:

311 pages, 189 Illustrations, color; 24 Illustrations, black and white; XXIII, 311 p. 213 illus., 18

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 27, 2022
ISBN13 9789811661228
Publishers Springer Verlag, Singapore
Pages 311
Dimensions 150 × 220 × 10 mm   ·   516 g
Editor Mahapatra, Souvik

Mere med samme udgiver