Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications - Springer Series in Advanced Microelectronics - Jacopo Franco - Books - Springer - 9789400776623 - October 29, 2013
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Jacopo Franco
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications - Springer Series in Advanced Microelectronics 2014 edition

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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

206 pages, 219 black & white illustrations, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released October 29, 2013
ISBN13 9789400776623
Publishers Springer
Pages 187
Dimensions 155 × 235 × 12 mm   ·   467 g
Language English  

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