From scientific instrument to industrial machine: Coping with architectural stress in embedded systems - SpringerBriefs in Electrical and Computer Engineering - Sjir Van Loo - Books - Springer - 9789400741461 - April 29, 2012
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Sjir Van Loo
From scientific instrument to industrial machine: Coping with architectural stress in embedded systems - SpringerBriefs in Electrical and Computer Engineering 2012 edition

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Architectural stress is the inability of a system design to respond to new market demands. It is an important yet often concealed issue in high tech systems. In this book, the authors look at the phenomenon of architectural stress in embedded systems in the context of a transmission electron microscope system built by FEI Company.

90 pages, 55 black & white illustrations, 1 black & white tables, 1 colour tables, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released April 29, 2012
ISBN13 9789400741461
Publishers Springer
Genre Aspects (Academic) > Science / Technology Aspects
Pages 112
Dimensions 155 × 235 × 6 mm   ·   185 g
Editor Doornbos, Richard
Editor Van Loo, Sjir

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