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Angewandte Oberflachenanalyse Mit Sims Sekundar-ionen-massenspektrometrie Aes Auger-elektronen-spektrometrie Xps Rontgen-photoelektronen-spektrometrie M. Grasserbauer Softcover Reprint of the Original 1st Ed. 1986 edition
Angewandte Oberflachenanalyse Mit Sims Sekundar-ionen-massenspektrometrie Aes Auger-elektronen-spektrometrie Xps Rontgen-photoelektronen-spektrometrie
M. Grasserbauer
302 pages, black & white illustrations
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | December 6, 2011 |
| Original release date | 2012 |
| ISBN13 | 9783642701788 |
| Publishers | Springer-Verlag Berlin and Heidelberg Gm |
| Pages | 302 |
| Dimensions | 170 × 244 × 17 mm · 503 g |
| Language | German |