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Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications - Springer Series in Materials Science Andrei Benediktovich 2014 edition
Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications - Springer Series in Materials Science
Andrei Benediktovich
The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis.
310 pages, 71 black & white illustrations, 37 colour illustrations, biography
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | September 18, 2013 |
| ISBN13 | 9783642381768 |
| Publishers | Springer-Verlag Berlin and Heidelberg Gm |
| Pages | 318 |
| Dimensions | 155 × 235 × 23 mm · 521 g |
| Language | German |
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