Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications - Springer Series in Materials Science - Andrei Benediktovich - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642381768 - September 18, 2013
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Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications - Springer Series in Materials Science 2014 edition

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The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis.


310 pages, 71 black & white illustrations, 37 colour illustrations, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released September 18, 2013
ISBN13 9783642381768
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 318
Dimensions 155 × 235 × 23 mm   ·   521 g
Language German  

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