Tell your friends about this item:
Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons - Springer Tracts in Modern Physics Mathias Schubert Softcover reprint of hardcover 1st ed. 2004 edition
Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons - Springer Tracts in Modern Physics
Mathias Schubert
The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy.
196 pages, biography
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | November 23, 2010 |
| ISBN13 | 9783642062285 |
| Publishers | Springer-Verlag Berlin and Heidelberg Gm |
| Pages | 196 |
| Dimensions | 155 × 235 × 11 mm · 299 g |
| Language | English |
More by Mathias Schubert
Show allMere med samme udgiver
See all of Mathias Schubert ( e.g. Hardcover Book and Paperback Book )