Contactless VLSI Measurement and Testing Techniques - Selahattin Sayil - Books - Springer International Publishing AG - 9783319888194 - September 4, 2018
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Selahattin Sayil
Contactless VLSI Measurement and Testing Techniques Softcover reprint of the original 1st ed. 2018 edition

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The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing.

93 pages, 11 Illustrations, color; 23 Illustrations, black and white; V, 93 p. 34 illus., 11 illus.

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 4, 2018
ISBN13 9783319888194
Publishers Springer International Publishing AG
Pages 93
Dimensions 150 × 220 × 10 mm   ·   184 g
Language German  

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