Characterization of Minerals, Metals, and Materials 2026: In-Situ Characterization Techniques - The Minerals, Metals & Materials Series -  - Books - Springer Nature Switzerland AG - 9783032135995 - February 18, 2026
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Characterization of Minerals, Metals, and Materials 2026: In-Situ Characterization Techniques - The Minerals, Metals & Materials Series

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The collection focuses on the advancements of characterization of minerals, metals, and materials and the applications of characterization results on the processing of these materials. Advanced characterization methods, techniques, and new instruments are emphasized. Areas of interest include but are not limited to:  Extraction and processing of various types of minerals, process–structure– property relationship of metal alloys, glasses, ceramics, polymers, composites, semiconductors, and carbon using functional and structural materialsNovel methods and techniques for characterizing materials across a spectrum of systems and processesCharacterization of mechanical, thermal, electrical, optical, dielectric, magnetic, physical, and other properties of metals, polymers, and ceramics including battery materialsCharacterization of structural, morphological, and topographical natures of materials at micro- and nano-scalesCharacterization of extraction and processing including process development and analysisAdvances in instrument development for microstructure analysis and performance evaluation of materials, such as computer tomography (CT), X-ray and neutron diffraction, electron microscopy (SEM, FIB, TEM), and spectroscopy (EDS, WDS, EBSD) techniques2D and 3D modeling for materials characterization

Media Books     Hardcover Book   (Book with hard spine and cover)
Released February 18, 2026
ISBN13 9783032135995
Publishers Springer Nature Switzerland AG
Pages 317
Dimensions 150 × 220 × 20 mm   ·   736 g
Language German  
Editor Escobedo-Diaz, Juan P.
Editor Hwang, Jiann-Yang
Editor Kalay, Yunus Eren
Editor Li, Bowen
Editor Li, Jian
Editor Monteiro, Sergio Neves
Editor Peng, Zhiwei
Editor Soman, Rajiv
Editor Xie, Kelvin Yu
Editor Zhang, Mingming

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