Ophthalmic Medical Image Analysis: 9th International Workshop, OMIA 2022, Held in Conjunction with MICCAI 2022, Singapore, Singapore, September 22, 2022, Proceedings - Lecture Notes in Computer Science - - Books - Springer International Publishing AG - 9783031165245 - September 9, 2022
In case cover and title do not match, the title is correct

Ophthalmic Medical Image Analysis: 9th International Workshop, OMIA 2022, Held in Conjunction with MICCAI 2022, Singapore, Singapore, September 22, 2022, Proceedings - Lecture Notes in Computer Science 1st ed. 2022 edition

Price
$ 54.99
excl. VAT

Ordered from remote warehouse

Expected to be ready for shipping Jul 21 - 27

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Not rated yet

This book constitutes the refereed proceedings of the 9th International Workshop on Ophthalmic Medical Image Analysis, OMIA 2022, held in conjunction with the 25th International Conference on Medical Imaging and Computer-Assisted Intervention, MICCAI 2022, in Singapore, Singapore, in September 2022. The 20 papers presented at OMIA 2022 were carefully reviewed and selected from 33 submissions. The papers cover various topics in the field of ophthalmic medical image analysis and challenges in terms of reliability and validation, number and type of conditions considered, multi-modal analysis (e.g., fundus, optical coherence tomography, scanning laser ophthalmoscopy), novel imaging technologies, and the effective transfer of advanced computer vision and machine learning technologies.

204 pages, 66 Illustrations, color; 9 Illustrations, black and white; XI, 204 p. 75 illus., 66 illus

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 9, 2022
ISBN13 9783031165245
Publishers Springer International Publishing AG
Pages 204
Dimensions 150 × 220 × 10 mm   ·   343 g
Language German  
Editor Antony, Bhavna
Editor Fu, Huazhu
Editor Lee, Cecilia S.
Editor MacGillivray, Tom
Editor Xu, Yanwu
Editor Zheng, Yalin

More from the same publisher