Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies - Antonio Manuel Lourenco Canelas - Books - Springer Nature Switzerland AG - 9783030415358 - March 21, 2020
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Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies 2020 edition

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This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm.


237 pages, 87 Tables, color; 97 Illustrations, color; 42 Illustrations, black and white; XXIII, 237

Media Books     Hardcover Book   (Book with hard spine and cover)
Released March 21, 2020
ISBN13 9783030415358
Publishers Springer Nature Switzerland AG
Pages 237
Dimensions 150 × 220 × 20 mm   ·   544 g
Language German  

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