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Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies Antonio Manuel Lourenco Canelas 2020 edition
Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
Antonio Manuel Lourenco Canelas
This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm.
237 pages, 87 Tables, color; 97 Illustrations, color; 42 Illustrations, black and white; XXIII, 237
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | March 21, 2020 |
| ISBN13 | 9783030415358 |
| Publishers | Springer Nature Switzerland AG |
| Pages | 237 |
| Dimensions | 150 × 220 × 20 mm · 544 g |
| Language | German |
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