Physical Measurement and Analysis of Thin Films - Progress in Analytical Chemistry - E M Murt - Books - Springer-Verlag New York Inc. - 9781489959126 - December 7, 2013
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E M Murt
Physical Measurement and Analysis of Thin Films - Progress in Analytical Chemistry Softcover reprint of the original 1st ed. 1969 edition

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194 pages, 99 black & white illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 7, 2013
ISBN13 9781489959126
Publishers Springer-Verlag New York Inc.
Pages 194
Dimensions 152 × 229 × 11 mm   ·   285 g
Language English  
Editor Murt, E. M.

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