Point and Extended Defects in Semiconductors - NATO Science Series B - Giorgio Benedek - Books - Springer-Verlag New York Inc. - 9781468457117 - April 16, 2013
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Point and Extended Defects in Semiconductors - NATO Science Series B Softcover reprint of the original 1st ed. 1989 edition

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The systematic study of defects in semiconductors began in the early fifties. Most participants are currently working on defect problems in either silicon submicron technology or in quantum wells and superlattices, where point defects, dislocations, interfaces and surfaces are closely packed together.


300 pages, black & white illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released April 16, 2013
ISBN13 9781468457117
Publishers Springer-Verlag New York Inc.
Pages 287
Dimensions 178 × 254 × 15 mm   ·   521 g
Language English  
Editor Benedek, Giorgio

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