Testing and Diagnosis of Analog Circuits and Systems - Ruey-wen Liu - Books - Springer-Verlag New York Inc. - 9781461597490 - March 8, 2012
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Ruey-wen Liu
Testing and Diagnosis of Analog Circuits and Systems Softcover reprint of the original 1st ed. 1991 edition

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Unfortunately, the prob lem for analog circuits is fundamentally different from and much more diffi cult than its counterpart for digital circuits. Therefore, even Ix x Preface though the analog circuit may be small, the total circuit under testing is large.

284 pages, 2 black & white illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released March 8, 2012
ISBN13 9781461597490
Publishers Springer-Verlag New York Inc.
Pages 284
Dimensions 152 × 229 × 16 mm   ·   408 g
Language English  

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