Analog IC Reliability in Nanometer CMOS - Analog Circuits and Signal Processing - Elie Maricau - Books - Springer-Verlag New York Inc. - 9781461461623 - January 9, 2013
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Elie Maricau
Analog IC Reliability in Nanometer CMOS - Analog Circuits and Signal Processing 2013 edition

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This book focuses on modeling, simulation and analysis of analog circuit aging. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared.

240 pages, 68 black & white illustrations, 27 colour illustrations, 16 black & white tables

Media Books     Hardcover Book   (Book with hard spine and cover)
Released January 9, 2013
ISBN13 9781461461623
Publishers Springer-Verlag New York Inc.
Pages 198
Dimensions 160 × 243 × 17 mm   ·   453 g
Language English  

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