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Nanoscale Memory Repair - Integrated Circuits and Systems Masashi Horiguchi 2011 edition
Nanoscale Memory Repair - Integrated Circuits and Systems
Masashi Horiguchi
Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations.
228 pages, biography
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | February 24, 2013 |
| ISBN13 | 9781461427940 |
| Publishers | Springer-Verlag New York Inc. |
| Pages | 218 |
| Dimensions | 155 × 235 × 12 mm · 353 g |
| Language | English |