Advances in X-Ray Analysis: Volume 17: Proceedings of the Twenty-Second Annual Conference on Applications of X-Ray Analysis held in Denver, August 22-24, 1973 - C Grant - Books - Springer-Verlag New York Inc. - 9781461399773 - May 28, 2013
In case cover and title do not match, the title is correct

Advances in X-Ray Analysis: Volume 17: Proceedings of the Twenty-Second Annual Conference on Applications of X-Ray Analysis held in Denver, August 22-24, 1973 Softcover reprint of the original 1st ed. 1974 edition

Price
$ 54.99
excl. VAT

Ordered from remote warehouse

Expected to be ready for shipping Jul 17 - 23
Add to your iMusic wish list

Not rated yet

The successful application of x-r~ diffraction techniques and x-r~ spectrometry depends in large measure on the availability of dependable standards and reference data. One of the purposes of the invited papers in this 22nd Annual Denver X-Ray Conference was tc review the status of programs to prepare such standards and reference data.


610 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released May 28, 2013
ISBN13 9781461399773
Publishers Springer-Verlag New York Inc.
Pages 596
Dimensions 178 × 254 × 31 mm   ·   1.05 kg
Language English  
Editor Grant, C.

Mere med samme udgiver