Testing and Reliable Design of CMOS Circuits - The Springer International Series in Engineering and Computer Science - Niraj K. Jha - Books - Springer-Verlag New York Inc. - 9781461288183 - September 26, 2011
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Niraj K. Jha
Testing and Reliable Design of CMOS Circuits - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1990 edition

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In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. However, the rapid advance ments in this area pose many new problems in the area of testing. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing.

246 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 26, 2011
ISBN13 9781461288183
Publishers Springer-Verlag New York Inc.
Pages 232
Dimensions 155 × 235 × 13 mm   ·   353 g
Language English  

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