Rapid Reliability Assessment of VLSICs - A.P. Dorey - Books - Springer-Verlag New York Inc. - 9781461278795 - March 8, 2012
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A.P. Dorey
Rapid Reliability Assessment of VLSICs Softcover reprint of the original 1st ed. 1990 edition

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The increasing application of integrated circuits in situations where high reliability is needed places a requirement on the manufacturer to use methods of testing to eliminate devices that may fail on service.

212 pages, black & white illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released March 8, 2012
ISBN13 9781461278795
Publishers Springer-Verlag New York Inc.
Pages 212
Dimensions 170 × 244 × 12 mm   ·   349 g
Language English  

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