Evaluation of Advanced Semiconductor Materials by Electron Microscopy - NATO Science Series B - David Cherns - Books - Springer-Verlag New York Inc. - 9781461278504 - October 13, 2011
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David Cherns
Evaluation of Advanced Semiconductor Materials by Electron Microscopy - NATO Science Series B Softcover reprint of the original 1st ed. 1989 edition

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With these developments in mind, an application was made to the NATO Science Committee in late summer 1987 to fund an Advanced Research Work shop to review the electron microscopy of advanced semiconductors.

412 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 13, 2011
ISBN13 9781461278504
Publishers Springer-Verlag New York Inc.
Pages 412
Dimensions 170 × 244 × 22 mm   ·   680 g
Language English  
Editor Cherns, David

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