Built-in-Self-Test and Digital Self-Calibration for RF SoCs - SpringerBriefs in Electrical and Computer Engineering - Sleiman Bou-Sleiman - Books - Springer-Verlag New York Inc. - 9781441995476 - September 22, 2011
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Sleiman Bou-Sleiman
Built-in-Self-Test and Digital Self-Calibration for RF SoCs - SpringerBriefs in Electrical and Computer Engineering 2012 edition

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This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).

106 pages, 70 black & white illustrations, 7 black & white tables, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 22, 2011
ISBN13 9781441995476
Publishers Springer-Verlag New York Inc.
Pages 89
Dimensions 155 × 235 × 5 mm   ·   163 g
Language English  

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