Extreme Statistics in Nanoscale Memory Design - Integrated Circuits and Systems - Amith Singhee - Books - Springer-Verlag New York Inc. - 9781441966056 - September 17, 2010
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Amith Singhee
Extreme Statistics in Nanoscale Memory Design - Integrated Circuits and Systems 2010 edition

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This discontinuity in design processes has led many researchers to develop effective methods of statistical design, where the designer can simulate not just the behavior of the nominal design, but the expected statistics of the behavior in manufactured ICs.

246 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released September 17, 2010
ISBN13 9781441966056
Publishers Springer-Verlag New York Inc.
Genre Aspects (Academic) > Science / Technology Aspects
Pages 246
Dimensions 155 × 235 × 15 mm   ·   539 g
Language English  
Editor Rutenbar, Rob A.
Editor Singhee, Amith

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