Power-constrained Testing of Vlsi Circuits: a Guide to the Ieee 1149.4 Test Standard - Frontiers in Electronic Testing - Nicolici, Nicola (Mcmaster University, Hamilton, Ontario, Canada) - Books - Springer-Verlag New York Inc. - 9781441953155 - December 9, 2010
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Nicolici, Nicola (Mcmaster University, Hamilton, Ontario, Canada)
Power-constrained Testing of Vlsi Circuits: a Guide to the Ieee 1149.4 Test Standard - Frontiers in Electronic Testing Softcover Reprint of the Original 1st Ed. 2003 edition

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This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

178 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 9, 2010
ISBN13 9781441953155
Publishers Springer-Verlag New York Inc.
Pages 178
Dimensions 155 × 235 × 10 mm   ·   276 g
Language English  

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