Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing - Erik Larsson - Books - Springer-Verlag New York Inc. - 9781441952691 - February 2, 2011
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Erik Larsson
Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing Softcover reprint of hardcover 1st ed. 2005 edition

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SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.

388 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released February 2, 2011
Original release date 2010
ISBN13 9781441952691
Publishers Springer-Verlag New York Inc.
Pages 388
Dimensions 150 × 220 × 10 mm   ·   571 g
Language English  

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