Yield Simulation for Integrated Circuits - the Springer International Series in Engineering and Computer Science - D.m.h. Walker - Books - Springer-Verlag New York Inc. - 9781441952011 - December 10, 2010
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D.m.h. Walker
Yield Simulation for Integrated Circuits - the Springer International Series in Engineering and Computer Science 1st Ed. Softcover of Orig. Ed. 1987 edition

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209 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 10, 2010
ISBN13 9781441952011
Publishers Springer-Verlag New York Inc.
Pages 209
Dimensions 155 × 235 × 12 mm   ·   317 g
Language English  

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