Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Methods of Surface Characterization - Alvin W Czanderna - Books - Springer-Verlag New York Inc. - 9781441932990 - December 6, 2010
In case cover and title do not match, the title is correct

Alvin W Czanderna
Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Methods of Surface Characterization 1st ed. Softcover of orig. ed. 1999 edition

Price
$ 158.49
excl. VAT

Ordered from remote warehouse

Expected to be ready for shipping Jul 3 - 9

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.

449 pages, 70 black & white illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 6, 2010
ISBN13 9781441932990
Publishers Springer-Verlag New York Inc.
Pages 430
Dimensions 152 × 229 × 23 mm   ·   625 g
Language English  
Editor Czanderna, Alvin W.
Editor Madey, Theodore E.
Editor Powell, Cedric J.

More by Alvin W Czanderna

Show all

Mere med samme udgiver

See all of Alvin W Czanderna ( e.g. Paperback Book )