Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - Alberto Bosio - Books - Springer-Verlag New York Inc. - 9781441909374 - November 4, 2009
In case cover and title do not match, the title is correct

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies 2010 edition

Price
$ 122.99
excl. VAT

Ordered from remote warehouse

Expected to be ready for shipping Jun 25 - Jul 7
Add to your iMusic wish list

Also available as:

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies.


171 pages, 22 black & white tables, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released November 4, 2009
ISBN13 9781441909374
Publishers Springer-Verlag New York Inc.
Pages 171
Dimensions 155 × 235 × 12 mm   ·   439 g
Language English  

Mere med samme udgiver