Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations - Rajesh Garg - Books - Springer-Verlag New York Inc. - 9781441909305 - November 16, 2009
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Rajesh Garg
Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations 2010 edition

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This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.

212 pages, 28 black & white tables, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released November 16, 2009
ISBN13 9781441909305
Publishers Springer-Verlag New York Inc.
Pages 212
Dimensions 159 × 238 × 24 mm   ·   508 g
Language English  

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