Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices - Epperlein, Peter W. (Pwe-PhotonicsElectronics-IssueResolution; University of Stuttgart, Germany) - Books - John Wiley & Sons Inc - 9781119990338 - February 22, 2013
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Epperlein, Peter W. (Pwe-PhotonicsElectronics-IssueResolution; University of Stuttgart, Germany)
Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices

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This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature.

522 pages, Illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released February 22, 2013
ISBN13 9781119990338
Publishers John Wiley & Sons Inc
Pages 520
Dimensions 160 × 236 × 38 mm   ·   771 g
Language English  

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