Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices - Paul Van Der Heide - Books - John Wiley & Sons Inc - 9781118480489 - September 15, 2014
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Paul Van Der Heide
Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices 1st edition

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This book serves as a practical reference for anyone involved in any form of Secondary Ion Mass Spectrometry (SIMS). This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications.

384 pages, illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released September 15, 2014
ISBN13 9781118480489
Publishers John Wiley & Sons Inc
Pages 384
Dimensions 160 × 243 × 24 mm   ·   657 g
Language English  

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