Terrestrial Radiation Effects in ULSI Devices and Electronic Systems - IEEE Press - Eishi H. Ibe - Books - John Wiley & Sons Inc - 9781118479292 - February 13, 2015
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Eishi H. Ibe
Terrestrial Radiation Effects in ULSI Devices and Electronic Systems - IEEE Press 1st edition

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This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions.

296 pages

Media Books     Hardcover Book   (Book with hard spine and cover)
Released February 13, 2015
ISBN13 9781118479292
Publishers John Wiley & Sons Inc
Pages 296
Dimensions 175 × 249 × 20 mm   ·   599 g
Language English  

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