Thermal-Aware Testing of Digital VLSI Circuits and Systems - Chattopadhyay, Santanu (Department of Electronics and Electrical Communication Engineering, Indian Institute of Technology Kharagpur, West Bengal, India) - Books - Taylor & Francis Inc - 9780815378822 - April 25, 2018
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Chattopadhyay, Santanu (Department of Electronics and Electrical Communication Engineering, Indian Institute of Technology Kharagpur, West Bengal, India)
Thermal-Aware Testing of Digital VLSI Circuits and Systems 1st edition

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This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.

118 pages, 10 Illustrations, black and white

Media Books     Hardcover Book   (Book with hard spine and cover)
Released April 25, 2018
ISBN13 9780815378822
Publishers Taylor & Francis Inc
Pages 118
Dimensions 225 × 145 × 14 mm   ·   296 g
Language English  

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