Topics in Electron Diffraction and Microscopy of Materials - Series in Microscopy in Materials Science - Peter. B Hirsch - Books - Taylor & Francis Ltd - 9780750305389 - 1999
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Peter. B Hirsch
Topics in Electron Diffraction and Microscopy of Materials - Series in Microscopy in Materials Science 1st edition

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Offers an overview of applications for selected electron microscope techniques that have become widespread in their use for furthering our understanding of how materials behave. This work discusses topics including weak-beam techniques for problem solving, defect structures and dislocation interactions, and atomic level imaging applications.

196 pages, 37 halftones, 40 line illustrations, index

Media Books     Hardcover Book   (Book with hard spine and cover)
Released 1999
ISBN13 9780750305389
Publishers Taylor & Francis Ltd
Pages 208
Dimensions 241 × 162 × 18 mm   ·   432 g
Language English  
Editor Hirsch, Peter. B (University Of Oxford, England, UK)

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