Applied Measurement with jMetrik - Meyer, J. Patrick (University of Virginia, USA) - Books - Taylor & Francis Ltd - 9780415531979 - June 25, 2014
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Meyer, J. Patrick (University of Virginia, USA)
Applied Measurement with jMetrik 1st edition

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Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis.

55 black & white illustrations, 4 black & white tables, 19 black & white line drawings

Media Books     Paperback Book   (Book with soft cover and glued back)
Released June 25, 2014
ISBN13 9780415531979
Publishers Taylor & Francis Ltd
Pages 170
Dimensions 229 × 153 × 9 mm   ·   266 g
Language English  

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