Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation - Alain Lodini - Books - Taylor & Francis Ltd - 9780415303972 - February 6, 2003
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Alain Lodini
Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation 1st edition

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Neutron and synchrotron X-ray diffraction have emerged as leading techniques for stress analysis. This book presents an overview of the principles of these techniques and examples of their applications to a range of materials and engineering problems. It contains 20 papers from leading international experts in residual stress analysis covering the

320 pages, 208 line figures, 23 half tones and 15 tables

Media Books     Hardcover Book   (Book with hard spine and cover)
Released February 6, 2003
ISBN13 9780415303972
Publishers Taylor & Francis Ltd
Pages 366
Dimensions 152 × 229 × 22 mm   ·   885 g
Language English  
Editor Fitzpatrick, M.E.
Editor Lodini, Alain

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