Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs - Brandon Noia - Books - Springer International Publishing AG - 9783319023779 - December 2, 2013
In case cover and title do not match, the title is correct

Brandon Noia
Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs 2014 edition

Price
$ 103.99
excl. VAT

Ordered from remote warehouse

Expected to be ready for shipping Jun 26 - Jul 2

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Also available as:

This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects. The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge research in this domain.

274 pages, 18 black & white illustrations, 115 colour illustrations, 23 black & white tables, biogra

Media Books     Hardcover Book   (Book with hard spine and cover)
Released December 2, 2013
ISBN13 9783319023779
Publishers Springer International Publishing AG
Pages 245
Dimensions 157 × 243 × 16 mm   ·   657 g
Language German  

Mere med samme udgiver

See all of Brandon Noia ( e.g. Hardcover Book and Paperback Book )